Overbridge Technology Honored with Worth-a-Look! Award at Graph Expo 2006

With Eclipse Count, press operators not only get accurate net signature counts, but pallet/skid creation and content, and real time and historical automated press production reporting.

In announcing the award, Overbridge principal Mark Daugherty said, “The users of Eclipse Count thought that the device should receive this recognition at Graph Expo. I am pleased they were proven to be correct. We are proud to be singled out as a Worth-a-Look award winner, given the huge number of innovative products shown at Graph Expo.”